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Show allOPTICAL AND STRUCTURAL CHARACTERIZATION OF FECUS TERNARY THIN FILMS
Abstract
Ternary thin films of Iron Copper Sulphide (FeCuS) have been grown and characterized. Optical, compositional, surface microstructure and structural characterization of the deposited films were carried out. Absorbance spectra data of the films were obtained using a Janway 6405 UV-VIS spectrophotometer, absorbance of the films were found to be high in UV and low in VIS – NIR region, while the transmittances were low in UV region and high in VIS – NIR regions. Elemental composition of the films were done using Skyray XRF Machine, EDX Pocket III, model P530. The machine was used to determine the percentage of each transition element present in the films. The surface microstructures of the films were characterized using Olympus Microscope at 100X magnification. XRD analysis of the films was carried out using Enhance Mini Material Analyzer (EMMA) X – Ray Diffractometer Machine, the as - deposited FeCuS thin film was found to have tetragonal structure. The lattice constants obtained are , and . The crystallite size of the film was calculated at wavelength of and the calculated grain size was found to be . The optical absorption study reveals that FeCuS thin film has a bandgap of 2.40eV and a refractive index range of to at 400nm. The reflectance of the deposited films was found to be generally low.
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References
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